U. Aebi, K. Bienz , Chr. Brack, G. Bullock, M. Duerrenberger, A. Engel, R. Gschwind, R. Guggenheim, W. Rudin, M. Wurtz.

Layout:

R. Häring (Text), R. Wyss (Drawings), D. Stoffler (HTML edition)

Contents

1. General Introduction

1.1 Light Microscopy

1.2. Electron Microscopy

1.3. Scanning Probe Microscopy (SPM)

2 Theoretical Foundations

2.1. Propagation of Light and Electrons

2.2. Optical Elements for Light

2.3. Optical Elements for Charged Particles

2.4. Optical Systems

2.5. Waves

2.6. Diffraction Theory

2.7 Fourier Transform Pairs

2.8 Image Formation

2.9 The Optical Diffractometer

2.10 Averaging and filtering

2.11 3-D Reconstruction

3. Light Microscopy

3.1. The Superposition of Waves

3.2. The Microscope and its Parts

3.3. Phase Contrast Microscopy

3.4. Fluorescence Microscopy

3.5. Photomicrography

3.7. Black-and-White Photomicrography

4. Electron Microscopy

4.1. Basic Concepts

4.2. The Electron Microscope:
Its Components, Operation, Maintenance, and Performance

4.3. Electron Diffraction

4.4. The Electron Microscope: Image Interpretation, and Limitations

4.5. High-Resolution Electron Microscopy of Proteins and their Supramolecular Assemblies

5. Different Types of Microscopies

5.1. Fixed Beam Microscopies

5.2. Scanned Microscopies

6. Specimen Preparation for Light and Electron Microscopy

6.1. Introduction to Specimen Preparation

6.2. Routine Specimen Preparation of Biological Material for Light (LM) and Electron Microscopy (EM)

6.3. Specific Preparation Techniques for EM:
Preparation of Small Particles and Macromolecules

6.4. Labeling Techniques

6.5. Specimen Preparation for Scanning Electron Microscopy (SEM)